A comprehensive range of sputtering materials and sizes available
Micro machined components in strategic materials such as molybdenum, tantalum, titanium and niobium
Garnet crystals and substrates for epitaxy
We supply high purity evaporation materials for vacuum vaporation in a variety of shapes and sizes.
Indium and gallium antimonide. The InSb detectors are sensitive between 1 µm to 5µm wavelengths.
Czochralski (Cz) and float zone (Fz) for a large range of semiconductor applications
Scratch, indentation and wear testing all on one tool at nano and micro load ranges
3D non-contact profilometers for collecting and analysing sample height data
Robust, modular, and powerful pin on disc tribometers
Non-contact technology measuring real time strength and direction of electrical currents
Reproducing the wear interaction between a surface and the human finger
Measurement of surface tension between liquids and solids
Determining thin film properties by change in polarisation of light
Measuring thin film properties by reflection
Tribology testing in ambient or tailored environments
Real life testing of finished products in respect of resistance to hand abrasion
Scratch & indentation for hardness, elastic modulus, adhesion, cohesion plus more
Gain a deeper understanding of your materials
Measure surface roughness, form, profile, finish plus more
Low damage plasma enhanced chemical vapour deposition
Low damage etching and nano structuring
Deposition of layers in the nanometer scale
Deposition of coatings by the vacuum evaporation technique
Deposition of coatings by the sputtering technique
The dispersion, mixing, pulverization or emulsification of materials
Scintillator materials grown in crystal form
Scintillator material in organic form
Materials for the measurement of radiation dose
Sapphire in sheet, tube, rod and component form
LiF, Quartz or SiO2, InSb, Si, Ge, PET, ADP, Beryl, TlAP, RbAP, KAP and CsAP
Bespoke leak testing systems for small or large parts
High performance laser optics from Alpine Research Optics
Powerful, easy to use and cost effective AI based image recognition
A comprehensive solution for laboratories using several types of microscope and profilometer
Benchmark technology for 2D and 3D surface texture analysis and metrology, seamlessly integrates with profilometers and other surface measuring equipment
Conductive coating on one side to prevent EMI/RFI
Plastic optical filter with broadband AR coating on both sides
Privacy Glass & Light Control Film
Crystal scintillators are specially grown for a variety of different applications. An excellent crystal should be dense, bright and fast.
High density and high atomic number increases the chance of gamma-ray interaction. Bright means more visible light is produced per unit energy absorbed and so detection is easier. Fast produces shorter pulses which enables faster data acquisition. There is no perfect scintillator so we supply a variety of crystal scintillators for different applications.
Luxium Solutions (previously Saint Gobain Crystals) are the premier scintillation detection manufacture for ionizing radiation detection and provide high quality scintillation materials with superior resolution and advanced photo-sensor integration. Their core technology is the manufacturer of high performance engineering materials to solve their customers’ unique challenges. Luxium Solutions and Mi-Net have been working together in the UK and Ireland for over 30 years.
You can scroll across this table using the scroll bar at the bottom of the table or in mobile you can swipe across using your fingers.
Scintillator | Comments | Light yield (photons/keV) | Light ouput(%) of NaI(Tl) bialkali pmt | Temperature coefficient of light output(%/C) 25oC to 50oC | 1/e Decay time(ns) | Wavelength of max emission lm(nm) | Refractive index at lm | Thickness to stop 50% of 662 keV photons (cm) | Thermal expansion (/C)x10-6 | Cleavage plane | Hardness (Mho) | Density g/cm3 | Hygroscopic | Scintillator |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
LaBr3(Ce+Sr) | Ultimate energy resolution (2.2% @ 662keV) | 73 | 190 | 0 | 25 | 385 | ~2.0 | 1.8 | 8 | <100> | 5.08 | yes | LaBr3(Ce+Sr) | |
LaBr3(Ce) | General purpose, excellent energy resolution | 63 | 165 | 0 | 16 | 380 | ~1.9 | 1.8 | 8 | <100> | 5.08 | yes | LaBr3(Ce) | |
CLLB, Cs2LiLaBr6(Ce) |
Dual Gamma-Neutron detection | 43 | 115 | 180 /1100 | 420 | ~1.85 | 2.2 | — | 4.2 | yes | CLLB, Cs2LiLaBr6(Ce) |
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NaI(Tl) | General purpose, good energy resolution | 38 | 100 | -0.3 | 250 | 415 | 1.85 | 2.5 | 47.4 | <100> | 2 | 3.67 | yes | NaI(Tl) |
NaI(Tl+Li) or NAIL | Neutron-Gamma Scintillator | 35 | 100 | -0.3 | 240, 1.4 μs 230. 1.1μs |
419 | 1.85 | 2.5 | 47.4 | <100> | 2 | 3.67 | yes | NaI(Tl+Li) |
LYSO
Lu1.8Y.2SiO5(Ce)
|
Bright, high Z, fast, dense, background from 176Lu activity | 33 | 87 | -0.28 | 36 | 420 | 1.81 | 1.1 | — | none | 7.1 | no | Engineered LYSO Lu1.8Y.2SiO5(Ce) | |
CdWO4 | Low afterglow, for use with photodiodes | 12-15 | 30-50 | -0.1 | 14000 | 475 | ~2.3 | 1 | 10.2 | <010> | 4-4.5 | 7.9 | no | CdWO4 |
CsI(Tl) | High Z, rugged, good match to photodiodes | 54 | 45 | 0.01 | 1000 | 550 | 1.79 | 2 | 54 | none | 2 | 4.51 | slightly | CsI(Tl) |
CsI(Na) | High Z, rugged | 41 | 85 | -0.05 | 630 | 420 | 1.84 | 2 | 54 | none | 2 | 4.51 | yes | CsI(Na) |
BGO | High Z, compact detector, low afterglow | 8 – 10 | 20 | -1.2 | 300 | 480 | 2.15 | 1 | 7 | none | 5 | 7.13 | no | BGO |
CaF2(Eu) | Low Z, a & b detection | 19 | 50 | -0.33 | 940 | 435 | 1.47 | 2.9 | 19.5 | <111> | 4 | 3.18 | no | CaF2(Eu) |
YAG(Ce) | b-ray, X-ray counting, electron microscopy | 8 | 15 | — | 70 | 550 | 1.82 | 2 | ~8 | none | 8.5 | 4.55 | no | YAG(Ce) |
CsI(Pure) | High Z, fast emission | 2 | 4-6 | -0.3 | 16 | 315 | 1.95 | 2 | 54 | none | 2 | 4.51 | slightly | CsI(Pure) |
BaF2 | Fast component (subnanosecond) | 1.8 | 3 | 0 | 0.6-0.8 | 220(195) | 1.54 | 1.9 | 18.4 | <111> | 3 | 4.88 | slightly | BaF2 |
Slow component | 10 | 16 | -1.1 | 630 | 310 | 1.50 | 1.9 | 18.4 | <111> | 3 | 4.88 | slightly | ||
ZnS(Ag) | Coated on BC-400 scintillator or UVT acrylic for Alpha detection | ~50 | 130 | -0.6 | 110 | 450 | 2.36 | — | — | — | — | 4.09 | no | ZnS(Ag) |
The data presented are believed to be correct but are not guaranteed to be so. |
Other products in the Saint Gobain Crystals range.
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