A comprehensive range of sputtering materials and sizes available
Micro machined components in strategic materials such as molybdenum, tantalum, titanium and niobium
Garnet crystals and substrates for epitaxy
We supply high purity evaporation materials for vacuum vaporation in a variety of shapes and sizes.
Indium and gallium antimonide. The InSb detectors are sensitive between 1 µm to 5µm wavelengths.
Czochralski (Cz) and float zone (Fz) for a large range of semiconductor applications
Scratch, indentation and wear testing all on one tool at nano and micro load ranges
3D non-contact profilometers for collecting and analysing sample height data
Robust, modular, and powerful pin on disc tribometers
Non-contact technology measuring real time strength and direction of electrical currents
Reproducing the wear interaction between a surface and the human finger
Measurement of surface tension between liquids and solids
Determining thin film properties by change in polarisation of light
Measuring thin film properties by reflection
Tribology testing in ambient or tailored environments
Real life testing of finished products in respect of resistance to hand abrasion
Scratch & indentation for hardness, elastic modulus, adhesion, cohesion plus more
Gain a deeper understanding of your materials
Measure surface roughness, form, profile, finish plus more
Low damage plasma enhanced chemical vapour deposition
Low damage etching and nano structuring
Deposition of layers in the nanometer scale
Deposition of coatings by the vacuum evaporation technique
Deposition of coatings by the sputtering technique
The dispersion, mixing, pulverization or emulsification of materials
Scintillator materials grown in crystal form
Scintillator material in organic form
Materials for the measurement of radiation dose
Sapphire in sheet, tube, rod and component form
LiF, Quartz or SiO2, InSb, Si, Ge, PET, ADP, Beryl, TlAP, RbAP, KAP and CsAP
Bespoke leak testing systems for small or large parts
High performance laser optics from Alpine Research Optics
Powerful, easy to use and cost effective AI based image recognition
A comprehensive solution for laboratories using several types of microscope and profilometer
Benchmark technology for 2D and 3D surface texture analysis and metrology, seamlessly integrates with profilometers and other surface measuring equipment
Conductive coating on one side to prevent EMI/RFI
Plastic optical filter with broadband AR coating on both sides
Privacy Glass & Light Control Film
The DENKweit B-INTEGRATE is a tool for measuring the direction and strength of electrical currents that can be mounted in-situ. It is fast, non- contact and does not require the user to apply an electrical current during measurement. Data is highly precise, quantitative and in real time so the B-INTEGRATE is ideal for quality control. It can also be used in desktop or hand held formats.
The B-INTEGRATE can be combined with the DENKweit AI software DENKnetze to automatically identify faults and features. DENKnetze is affordable and easy to use.
DENKweit from Halle Germany are an award winning 2018 spin out from the Fraunhofer Institute. Their innovative Magnetic Field Imaging technology combined with their own AI solution DENKnetze has already been sold to a number of world renowned companies and institutes across a variety of applications.
Spatial resolution | 2.5mm in x, µm range in y and z |
Magnetic field resolution | 0.3µT |
Power supply | 230V, 50/60 Hz, 8A |
Sensor | 3-axis magnetic field sensor from B-Tech series |
Other instruments in the Testing & Analysis range
We’re here and ready to provide information and answers to your questions
©Mi-Net 2023. All Rights Reserved.
Website by Fifteen.co.uk