Roughness and ISO parameters

Use advanced filtering techniques compliant with ISO 16610 to seperate roughness and waviness components of surfaces.

Perform roughness analysis and calculate surface texture parameters:

• 3D parameters from ISO 25178: height (Sa, Sq, Ssk, Sku, Sz, etc.,) and functional (Smr, Smc, Sxp) parameters.
• ISO 4287 (and ISO 21290) primary and roughness parameters (Ra, Rq, Rsk, Rmr, Rdc, Rdq, RPc, etc.).

Access ASME B46.1 2D and 3D parameters (USA),  GB/T (China), DIN (Germany), JIS (Japan), NF (France), BSI (UK), UNE (Spain) and UNI (Italy) etc.

Carry out functional analysis:

• Abbott-Firestone bearing ratio curve and depth distribution histogram.
• Subtraction of one surface from another (wear).
• Assessment of the material/void volume ratio and thickness of up to three vertical slices of a surface.

Data Correction

Get your measured data ready for analysis and eliminate outliers, local defects, and noise using a variety of tools, such as:

• Level
• Flip (horizontal or vertical axis)
• Rotate
• Zone extraction
• Correction or deletion of abnormal scan lines
• Threshold (remove spikes)
• Retouch isolated artifacts
• Deconvolution to reduce tip impact in measurements
• Filling in non-measured data points.
• Surface smoothing
• Resample to improve image resolution

Surface Geometry

Analyse surface geometry efficiently and precisely using our suite of measurement tools, which includes:

• Distances.
• Angles.
• Areas of peaks and valleys.
• Volumes of bumps and holes.
• Step heights on surfaces and profiles.
• Coplanarity.

Surface Stitching

• Seamlessly combine multiple measurements that overlap on the horizontal plane.

• Interactively merge two or more surface measurements taken at different heights into a single surface to effectively increase vertical range for analysis.

Sub-surface Analysis

• Quickly extract a rectangular or non-rectangular region of interest from a surface.
• Remove a slice from a surface by setting a threshold value.
• Automatically partition a surface into texture cells or motifs, and then extract and level a sub-surface.

After a sub-surface or region of interest has been extracted, it can be analysed using the same parameters as on full surfaces. This allows for detailed analysis of specific features, such as roughness, flatness, and coplanarity of planes on mechanical, electronic, and MEMS components.

Shell analysis (freeform surfaces)

Visualize and analyse shells:

• Import, visualize, and analyse freeform surfaces (shells) in various file formats such as STL, OBJ, PLY & 3MF.
• Process data acquired by profilometers with multiple scanning axes.
• Manage applications that require a multi-angle view of the data, such as additive manufacturing or X-ray tomography scans.
• Extract specific areas of interest from a shell and perform analysis.
• Derive surfaces and parametric profiles from shells and analyse them further.

Carry out metrological studies on shells:

• Display surface curvature and deviation in 3D using color maps
• Fit a reference form such as a planar, cylindrical or spherical surface
• Calculate a smooth reference surface by applying a Gaussian-like filter
• Compute a range of freeform surface texture parameters, including height, hybrid/spatial, and volume parameters

Advanced Contour Analysis

• Extract a vertical (x,z) or horizontal (x,y) contour (profile) from any surface of interest
• Establish nominal form using interactive tools and associate geometric elements with contours
• Calculate dimensions including distances, radii, diameters, and angles using automatic, interactive tools
• Study measured data with regard CAD models (DXF) or define nominal form
• Fix tolerances, including large positional tolerances
• Inspect form deviation and display graphically
• Generate tables of results, including pass/fail for efficient reporting
• Conduct Gothic arch analysis of bearings and gain valuable insights.

Particle Analysis and More

Particle analysis:

• Automatically identify and quantify grains, particles, islands, bumps, holes, and motifs (texture cells) using specific detection techniques
• Segment particles into groups based on several criteria
• Create control charts, histograms, and scatter plots

Fourier & wavelets analysis

• Perform frequency analysis.
• Calculate parameters for isotropy, directionality, and periodicity. Visualize dominant surface directions.
• Denoise surfaces.
• Apply discrete wavelet filtering to 3D surfaces and 2D profiles.
• Conduct continuous wavelet decomposition.

4D analysis

• Perform 4D analysis with respect to time, temperature, magnetic field, or another dimension.
• See animated views of surface change
• Generate statistics on surface texture change.
• Use the Karhunen-Loève transform (principal component analysis).

Correlative Analysis

• Conduct correlative analysis on data from various profilers or microscopes seamlessly with a single software solution.
• Locate the same features on 3D surface topography data and images acquired from different instruments (e.g. SEM, AFM).

Left: colocalization of an SEM image and an optical microscope image.