A comprehensive range of sputtering materials and sizes available
Micro machined components in strategic materials such as molybdenum, tantalum, titanium and niobium
Garnet crystals and substrates for epitaxy
We supply high purity evaporation materials for vacuum vaporation in a variety of shapes and sizes.
Indium and gallium antimonide. The InSb detectors are sensitive between 1 µm to 5µm wavelengths.
Czochralski (Cz) and float zone (Fz) for a large range of semiconductor applications
Scratch, indentation and wear testing all on one tool at nano and micro load ranges
3D non-contact profilometers for collecting and analysing sample height data
Robust, modular, and powerful pin on disc tribometers
Non-contact technology measuring real time strength and direction of electrical currents
Reproducing the wear interaction between a surface and the human finger
Measurement of surface tension between liquids and solids
Determining thin film properties by change in polarisation of light
Measuring thin film properties by reflection
Tribology testing in ambient or tailored environments
Real life testing of finished products in respect of resistance to hand abrasion
Scratch & indentation for hardness, elastic modulus, adhesion, cohesion plus more
Gain a deeper understanding of your materials
Measure surface roughness, form, profile, finish plus more
Low damage plasma enhanced chemical vapour deposition
Low damage etching and nano structuring
Deposition of layers in the nanometer scale
Deposition of coatings by the vacuum evaporation technique
Deposition of coatings by the sputtering technique
The dispersion, mixing, pulverization or emulsification of materials
Scintillator materials grown in crystal form
Scintillator material in organic form
Materials for the measurement of radiation dose
Sapphire in sheet, tube, rod and component form
LiF, Quartz or SiO2, InSb, Si, Ge, PET, ADP, Beryl, TlAP, RbAP, KAP and CsAP
Bespoke leak testing systems for small or large parts
High performance laser optics from Alpine Research Optics
Powerful, easy to use and cost effective AI based image recognition
A comprehensive solution for laboratories using several types of microscope and profilometer
Benchmark technology for 2D and 3D surface texture analysis and metrology, seamlessly integrates with profilometers and other surface measuring equipment
Conductive coating on one side to prevent EMI/RFI
Plastic optical filter with broadband AR coating on both sides
Privacy Glass & Light Control Film
The JR25 profilometer from Nanovea allow you to take the power of a desktop profilometer directly to your sample. Ideal for measuring samples that are difficult to move or for labs where you need to pack your profilometer away after use to save space.
Also sold to customers where the sample must remain stationary during measurements. Typical examples include powders and samples submerged in liquid.
Equipped with a 25mm x 25mm stage with interchangeable measurement sensors allowing measurement of a wide range of sample geometries both dull and reflective in finish.
Nanovea Inc are based in Irvine, a tech hub of Southern California. They have been redefining standards in quality control and materials development internationally for over a decade. Nanovea’s instruments can be found in renowned education and industrial organisations around the world.
3D non-contact profilometry can be used across a range of different applications to provide vital height data about your samples.
Chromatic Confocal technique uses white light that passes through a series of lenses with high degree of chromatic aberrations. Each wavelength will focus at a different distance creating the vertical measurement range. When a surface of interest is within the measurement range a single wavelength of the white light will be in focus while all others will be out of focus. Only the focused wavelength will pass through the pin hole filter to reach the CCD spectrometer. The physical wavelength measured corresponds to a vertical position. No complex algorithms are used to obtain the height value ensuring accurate results for all surface conditions unlike other techniques.
JR25 Base Specifications | |
X-Y Stage Travel | 200mm x 150mm |
Z-Axis Travel | 50mm motorized (extra manual z-clearance is available) |
X-Y Max Speed | 40mm/s |
Sensor Specifications | ||||||
Standard Speed | PS1 | PS2 | PS3 | PS4 | PS5 | PS6 |
Max Height Range | 110µm | 300µm | 1.1mm | 3.5mm | 10mm | 24mm |
Working Distance | 3.35mm | 10.8mm | 12.0mm | 16.2mm | 25.9mm | 20mm |
Lateral X-Y Accuracy | 0.9µm | 1.2µm | 2.0µm | 3.0µm | 7.0µm | 8.0µm |
Height Repeatability* | 1.2nm | 2.2nm | 3.4nm | 17nm | 31nm | 41nm |
*Fixed point measurement on glass. Ra average height variation for 1,200 points (100 sampling).
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