A comprehensive range of sputtering materials and sizes available
Micro machined components in strategic materials such as molybdenum, tantalum, titanium and niobium
Garnet crystals and substrates for epitaxy
We supply high purity evaporation materials for vacuum vaporation in a variety of shapes and sizes.
Indium and gallium antimonide. The InSb detectors are sensitive between 1 µm to 5µm wavelengths.
Czochralski (Cz) and float zone (Fz) for a large range of semiconductor applications
Scratch, indentation and wear testing all on one tool at nano and micro load ranges
3D non-contact profilometers for collecting and analysing sample height data
Robust, modular, and powerful pin on disc tribometers
Non-contact technology measuring real time strength and direction of electrical currents
Reproducing the wear interaction between a surface and the human finger
Measurement of surface tension between liquids and solids
Determining thin film properties by change in polarisation of light
Measuring thin film properties by reflection
Tribology testing in ambient or tailored environments
Real life testing of finished products in respect of resistance to hand abrasion
Scratch & indentation for hardness, elastic modulus, adhesion, cohesion plus more
Gain a deeper understanding of your materials
Measure surface roughness, form, profile, finish plus more
Low damage plasma enhanced chemical vapour deposition
Low damage etching and nano structuring
Deposition of layers in the nanometer scale
Deposition of coatings by the vacuum evaporation technique
Deposition of coatings by the sputtering technique
The dispersion, mixing, pulverization or emulsification of materials
Scintillator materials grown in crystal form
Scintillator material in organic form
Materials for the measurement of radiation dose
Sapphire in sheet, tube, rod and component form
LiF, Quartz or SiO2, InSb, Si, Ge, PET, ADP, Beryl, TlAP, RbAP, KAP and CsAP
Bespoke leak testing systems for small or large parts
High performance laser optics from Alpine Research Optics
Powerful, easy to use and cost effective AI based image recognition
A comprehensive solution for laboratories using several types of microscope and profilometer
Benchmark technology for 2D and 3D surface texture analysis and metrology, seamlessly integrates with profilometers and other surface measuring equipment
Conductive coating on one side to prevent EMI/RFI
Plastic optical filter with broadband AR coating on both sides
Privacy Glass & Light Control Film
The PB1000 mechanical tester from Nanovea is capable of scratch, hardness and wear testing across both Nano and Micro load ranges all on one flexible tool. Test loads are possible from Nano through to 400N giving one of the largest load ranges available on the market on one single tool. All test modes utilise true closed loop feedback load control from independent load and depth sensors giving unmatched accuracy and repeatability.
The tool sits on it’s own stand alone air table with isolation cabinet and can perform testing on a large 200 x 150mm stage.
Nanovea Inc are based in Irvine, a tech hub of Southern California. They have been redefining standards in quality control and materials development internationally for over a decade. Nanovea’s instruments can be found in renowned education and industrial organisations around the world.
The PB1000 mechanical tester has a wide range of testing capabilities all with high accuracy and repeatability.
The PB1000 is capable of Nano and Micro indentation, scratch or wear testing all on the same tool.
During the build there are optical options that can be added to the PB1000 mechanical tester.
AFM expands 3D capabilities into the angstrom measurement range. This includes lateral resolution which is not possible using optical techniques.
Lateral Resolution | 1.7nm |
Height Resolution | 0.4nm | 0.13nm |
Modes | Static, Dynamic & Extended |
X-Y Scan Range | 110µm |
X-Y Scan Resolution | 25µm |
Calibration With Indenter | Accurate to within under 0.2µm of indenter position |
The addition of a video microscope allows the user to visually examine their sample before selecting where to make a mechanical test. It is also used to image scratches for analysis within the tool software.
Objective Magnification | Up to 100x |
Colour Video Camera |
1200 x 1600 |
Calibration With Indenter | Accurate to within under 0.2µm of indenter position |
Image Stitching | Large area stitching capability |
A 3D Optical Profiler can be used to scan and analyze samples before, after or independently from a mechanical test. A Nanovea profilometer is mounted on the PB1000 and powerful analysis software is installed onto the tool PC.
Max Z Range | up to 3mm |
Surface Measurements | 2D & 3D Non-Contact |
Calibration With Indenter | Accurate to within under 0.2µm of indenter position |
Scan Area | Large surface scan with no image stitching required |
Measurement capability | Any roughness, any material with high accuracy |
Base Specifications | |
X-Y Stage Travel | 200mm x 150mm |
XY Lateral Resolution | 0.1µm |
Z Motorized Approach | 50mm |
Adjustable Z-Clearance | 140mm extra manual height adjustment |
Test Modules | ||
Nano Module | Specification | Micro Module |
Indentation, scratch, wear & friction | Modes of Testing | Indentation, scratch, wear & friction |
80 | 400 | 1800 | 4800mN | Load Range | 20 | 40 | 200 |400N |
250 | 1500µm | Depth Range | 1mm |
40 | 400 | 1800mN | Friction Range | 20 | 200N |
150-400kHz | Acoustic Emission Frequencies | 150 – 400kHz |
0.1 to 100Hz | DMA/CSM Frequencies | N/A |
5 minutes for 100 indents | Fastmap | 12 minutes for 100 indents |
275° | 450°C | High Temperature | 275° | 450° | 600°C |
Down to -10°C | <-40°C | Low Temperature | Down to -10°C | <-40°C |
5% to Dew Point | Humidity | 5% to Dew Point |
Yes | Liquid | Yes |
Values separated by | indicate different build options. |
Resources related to the Nanovea range of mechanical testers.
Other instruments in the Nanovea range.
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