A comprehensive range of sputtering materials and sizes available
Micro machined components in strategic materials such as molybdenum, tantalum, titanium and niobium
Garnet crystals and substrates for epitaxy
We supply high purity evaporation materials for vacuum vaporation in a variety of shapes and sizes.
Indium and gallium antimonide. The InSb detectors are sensitive between 1 µm to 5µm wavelengths.
Czochralski (Cz) and float zone (Fz) for a large range of semiconductor applications
Scratch, indentation and wear testing all on one tool at nano and micro load ranges
3D non-contact profilometers for collecting and analysing sample height data
Robust, modular, and powerful pin on disc tribometers
Non-contact technology measuring real time strength and direction of electrical currents
Reproducing the wear interaction between a surface and the human finger
Measurement of surface tension between liquids and solids
Determining thin film properties by change in polarisation of light
Measuring thin film properties by reflection
Tribology testing in ambient or tailored environments
Real life testing of finished products in respect of resistance to hand abrasion
Scratch & indentation for hardness, elastic modulus, adhesion, cohesion plus more
Gain a deeper understanding of your materials
Measure surface roughness, form, profile, finish plus more
Low damage plasma enhanced chemical vapour deposition
Low damage etching and nano structuring
Deposition of layers in the nanometer scale
Deposition of coatings by the vacuum evaporation technique
Deposition of coatings by the sputtering technique
The dispersion, mixing, pulverization or emulsification of materials
Scintillator materials grown in crystal form
Scintillator material in organic form
Materials for the measurement of radiation dose
Sapphire in sheet, tube, rod and component form
LiF, Quartz or SiO2, InSb, Si, Ge, PET, ADP, Beryl, TlAP, RbAP, KAP and CsAP
Bespoke leak testing systems for small or large parts
High performance laser optics from Alpine Research Optics
Powerful, easy to use and cost effective AI based image recognition
A comprehensive solution for laboratories using several types of microscope and profilometer
Benchmark technology for 2D and 3D surface texture analysis and metrology, seamlessly integrates with profilometers and other surface measuring equipment
Conductive coating on one side to prevent EMI/RFI
Plastic optical filter with broadband AR coating on both sides
Privacy Glass & Light Control Film
Our surface & chemical analysis lab services are offered in partnership with our colleagues at Nanovea Europe. We are able to provide comprehensive measurement reports for your samples using techniques such as Infrared (IR) Spectroscopy, Chromatography, Electron Microscopy, Atomic Force Microscopy (AFM), and X-Ray Diffraction.
We can provide measurements based on ASTM and ISO standards or we can design custom tests for your specific requirements.
Urgent expedited testing is available on request. Additional tests are available so visit our Lab Testing Services web page for a full list.
Contact us today to discuss your needs.
Nanovea Inc are based in Irvine, a tech hub of Southern California. They have been redefining standards in quality control and materials development internationally for over a decade. Nanovea’s instruments can be found in renowned education and industrial organisations around the world.
IR Spectroscopy
IR Spectral Analysis of known and unknown materials. Analysis performed with FTIR-ATR method without pre-treatment. Functional groups definition.
Chromotography
GC-MS, LC-MS
Qualitative/semi-qualitative identification of components in oils and organic materials subjected to tribological testing.
Electron Microscopy
TEM, FE-SEM/EDS
Punctual microanalysis or elements map distribution.
Thermo-Gravimetric & Thermo-Volumic Analysis
TGA – With Nitrogen Flux or oxidative atmosphere. Range temperature (-90C, 500C). Minimum mass sample to test 10mg.
DSC – Qualitative/semi-quantitative identification of components in oils and organic materials subjected to tribological testing.
Atomic Force Microscopy (AFM)
High resolution AFM analysis for topology and advanced 3D information at sub nanoscale.
X-Ray Diffraction
X-ray diffraction on powder and massive samples.
X-ray diffraction data analysis.
Quantitive definition of the crystal composition (Rietveld method).
Residual stress definition.
Other lab services available via our partners
We’re here and ready to provide information and answers to your questions
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