A comprehensive range of sputtering materials and sizes available
Micro machined components in strategic materials such as molybdenum, tantalum, titanium and niobium
Garnet crystals and substrates for epitaxy
We supply high purity evaporation materials for vacuum vaporation in a variety of shapes and sizes.
Indium and gallium antimonide. The InSb detectors are sensitive between 1 µm to 5µm wavelengths.
Czochralski (Cz) and float zone (Fz) for a large range of semiconductor applications
Scratch, indentation and wear testing all on one tool at nano and micro load ranges
3D non-contact profilometers for collecting and analysing sample height data
Robust, modular, and powerful pin on disc tribometers
Advanced 3D optical measurement solutions for quality assurance in production
Non-contact technology measuring real time strength and direction of electrical currents
Reproducing the wear interaction between a surface and the human finger
Measurement of surface tension between liquids and solids
Determining thin film properties by change in polarisation of light
Measuring thin film properties by reflection
Tribology testing in ambient or tailored environments
Real life testing of finished products in respect of resistance to hand abrasion
Scratch & indentation for hardness, elastic modulus, adhesion, cohesion plus more
Gain a deeper understanding of your materials
Measure surface roughness, form, profile, finish plus more
Low damage plasma enhanced chemical vapour deposition
Low damage etching and nano structuring
Deposition of layers in the nanometer scale
Deposition of coatings by the vacuum evaporation technique
Deposition of coatings by the sputtering technique
The dispersion, mixing, pulverization or emulsification of materials
Scintillator materials grown in crystal form
Scintillator material in organic form
Materials for the measurement of radiation dose
Sapphire in sheet, tube, rod and component form
LiF, Quartz or SiO2, InSb, Si, Ge, PET, ADP, Beryl, TlAP, RbAP, KAP and CsAP
Bespoke leak testing systems for small or large parts
High performance laser optics from Alpine Research Optics
Powerful, easy to use and cost effective AI based image recognition
A comprehensive solution for laboratories using several types of microscope and profilometer
Benchmark technology for 2D and 3D surface texture analysis and metrology, seamlessly integrates with profilometers and other surface measuring equipment
Conductive coating on one side to prevent EMI/RFI
Plastic optical filter with broadband AR coating on both sides
Privacy Glass & Light Control Film
TarazSharp is proprietary software, designed to seamlessly integrate with all Taraz products. Offering a wide range of functionalities, it includes surface measurements, equipment characterisation and flatness correction, ensuring accurate and reliable results.
With an intuitive, user-friendly interface, TarazSharp enhances the user experience, making complex measurements and analysis both efficient and straightforward.
TarazSharp can be used to power other custom-made fringe projection systems. It is made to be hardware-independent. Ger in touch to discuss how it can be used to power your existing system.
Taraz Metrology was born out of the University of Nottingham’s Manufacturing Metrology Team, combining cutting-edge research and proven expertise. They provide high-quality measurement solutions that play a critical role in quality assurance in production processes globally, driving efficiency and sustainability across industries.
A key benefit is the transparency of the calibration (characterisation) process. A lot of settings can be modified to suit customers specific purposes through providing an option for users to generate different models and sub-groups within a dataset. This benefits research and development users.
Another key benefit is our software’s modular design, which allows us to easily add custom tabs and analysis buttons based on customer requirements. This approach ensures the software remains fully adaptable and tailored to the specific needs of each user
Users are recommended to perform characterisation every 6 months or when the operating environment changes, as external factors such as ambient temperature changes may lead to minor alignment shifts.
After characterisation, if enhanced accuracy is required, users can opt for flatness correction.
For measurement, the Mono Measurement mode or the Stereo Measurement mode can be used for different workpieces.
Resources related to the Taraz range of systems for 3D Optical Metrology.
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Other instruments in our Testing & Analysis range
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