Ellipsometers
Determining thin film properties by change in polarisation of light
Ellipsometry is an optical technique used to measure the properties of thin films. An Ellipsometer will measure the change in polarisation of light reflected off a samples and use this in modelling to determine values such as thickness, refractive index and more.
Combined laser ellipsometry and spectroscopic reflectometry
Cost effective spectroscopic ellipsometer
Widest spectral range from 190nm (DUV) to 3,500nm (NIR) for thin and thick films
FTIR infrared spectroscopic ellipsometer
Automated spectroscopic ellipsometer
Cassette loaded automated spectroscopic ellipsometer
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